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sci.thin-film-interference Calculator
Calculates thin-film constructive and destructive interference conditions for reflected and transmitted light: 2nt cos θ = mλ (constructive for air-film-air, antireflective for air-film-substrate). Quarter-wave antireflection coating n_film = √(n_sub): single-layer MgF₂ (n=1.38) on glass (n=1.52) reduces reflection from 4% to 1% at 550 nm.
Inputs
N Film
Reference formula or conversion factor shown for context.
T Nm
Perpendicular measurement through the material. For insulation: thicker is better. For beams: directly affects bending resistance.
N Substrate
Amount per unit of time or per unit quantity. Check the denominator before interpreting.
Lambda Nm
Distance between successive wave crests. Related to frequency: λ = speed / frequency.